JPS5318268Y2 - - Google Patents
Info
- Publication number
- JPS5318268Y2 JPS5318268Y2 JP4026972U JP4026972U JPS5318268Y2 JP S5318268 Y2 JPS5318268 Y2 JP S5318268Y2 JP 4026972 U JP4026972 U JP 4026972U JP 4026972 U JP4026972 U JP 4026972U JP S5318268 Y2 JPS5318268 Y2 JP S5318268Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4026972U JPS5318268Y2 (en]) | 1972-04-05 | 1972-04-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4026972U JPS5318268Y2 (en]) | 1972-04-05 | 1972-04-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS49866U JPS49866U (en]) | 1974-01-07 |
| JPS5318268Y2 true JPS5318268Y2 (en]) | 1978-05-16 |
Family
ID=27911258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4026972U Expired JPS5318268Y2 (en]) | 1972-04-05 | 1972-04-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5318268Y2 (en]) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53135820U (en]) * | 1977-04-02 | 1978-10-27 | ||
| JPS5444413U (en]) * | 1977-09-02 | 1979-03-27 | ||
| JPS5880900A (ja) * | 1981-11-05 | 1983-05-16 | アメリカン・テツク・マニユフアクチアリング・インク | 電子部品のリ−ド矯正方法およびその装置 |
-
1972
- 1972-04-05 JP JP4026972U patent/JPS5318268Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS49866U (en]) | 1974-01-07 |